Effect of sub-grain boundaries in CdZnTe on HgCdTe film grown by molecular beam epitaxy
Date: July 10, 2025 | Author: J.C. Kong | Hits: 10
HgCdTe films grown by molecular beam epitaxy (MBE) are essential for creating high-performance infrared focal plane arrays (IRFPAs) like dual band detectors, high operating temperature (HOT) detectors, and avalanche photodiode (APD) detectors. CdZnTe is recognized as the optimal substrates for growing high crystal quality HgCdTe due to its lattice matching, which is adjusted by selecting the Zn mole fraction. However, defects like grain boundaries, twins, inclusions, dislocations, and sub-grai ...